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AW-XDM2000 X-ray diffractometer
AW-XDM2000 X-ray diffractometer

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X-ray diffractometer

 

X-ray diffractometer systems have been widely used for determining the phases nature and analyzing ration of sample, measuring macroscopical stress, microscopical strees and crystal particle size. So The X-ray diffractometer systems can be used widely in material science, physics, chemistry, metallurgy, mineral science,archeology, detective technology, inspecting commodity , producing medicament, plastic, chinaware , and so on. X-ray diffractometer systems are necessary equipments for analyzing material in university, scientific research institution and material factories.

 

AW-XDM2000 X-ray diffractometer system is one of the latest products that our company developed. The X-ray diffractometer systems have the following characteristic: precise design, perfect function for all kinds of analyzing, such as analyzing microscopical structure, analyzing crystal structure, determining phases nature and ration analyzing , indexing diffraction chart and measuring array parameter , measuring rest stress , analyzing structure and so on. Base on the X-ray diffraction controlling technology from the Philips, the hardware and software of the X-ray diffractometer systems have been improved with advanced technology and parts. The technical capability and automatization degree of the X-ray diffractometer systems are in lead position in the world.

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